Equipments

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Ferrite Testing equipments

MagMeter MF300F+

The MF300F measures ferrite number of austenitic and duplex stainless-steel weld material. The probe benefits from a novel magnetic system with excellent coupling to a measurement sample that is sensitive to ferrite content in 10mm area to a depth of approximately 1mm.

Hardness Testing equipment

Equoptip3 Hardness Tester

The Equotip3 is a versatile portable metal hardness tester. Its’ measuring principle is a simple, dynamic hardness test. An impact body with a hard metal test tip is propelled by spring force against the surface of the test piece. Deformation will take place on the test surface which results in loss of kinetic energy. Energy loss calculate by velocity measurements when the impact body is at a precise distance from the surface for both the impact and the rebound phase of the test.

Magnetic Particle Inspection equipment

Parker PM50 Permanent Magnetic Yoke Set

Permanent magnet with the WCP-2 aerosol which provides high contrast background to improve the probability of detection and sensitivity during visible magnetic particle inspections. The aerosol spray evenly without flaking so when non-fluorescent / colored magnetic particles are applied, the indications appear clearly against opaque white background.

Penetrant Testing equipment

Dye Penetrant Set

Set of Magnalux dye penetrant testing consumable products in aerosol form for penetrant non-destructive testing. Consist of solvent based developer, NDT cleaner & remover and solvent removable penetrant.

Positive Material Identification equipments

Hitachi (PMI-Master Smart)

The PMI-MASTER Smart is a breakthrough for optical emission spectroscopy (OES) analysis in hard to reach places. Weighing at 15kg/33 lbs, the spectrometer can be easily carried to the point of analysis. It is designed for precise analysis of key elements, rapid material verification, PMI, and metal sorting. Despite its light weight and compact size, it offers high analytical performance, unparalleled portability, convenience, and ease of use.

UVTOUCH Probe

Used for low levels of carbon, phosphorus, sulfur, boron, arsenic and tin in low allow and stainless steels, L grade separation and nitrogen in duplex steels. Able to display analysis results and control main spectrometer functions. Probe’s optic wavelength range is 165 to 210nm.

Radiographic Testing equipments

Densitometer DDS2

Portable densitometer for on-the-viewer measuring of transmission densities. It has remote probe for precise aligning of probe aperture and required readings.

NDS Survey Meter

Survey meter able to display in mR/hr or µSv/hr. Gamma and X-ray within 50 to 2,000 KeV. Three ranges 0-1000, 0-100, 0-10 mR/hr and 0-10,000, 0-1000, 0-100uSv/hr. Halogen quenched, Energy compensated GM Tube, Effective Length and Diamater: 0.625” x 0.194”.

Sentinel Source Projector

The Sentinel Source Projector is a portable, lightweight and compact industrial radiographic exposure device. The device body consist of a titanium ‘S’ tube and cast depleted uranium (DU) shield contained within a 300 series stainless steel tube with stainless steel disc welded at each end forming a cylinder-shaped housing. The discs are recessed to provide protection for the rear mounted locking mechanism and front mounted outlet port.

Sentinel Extreme Complete Wind-out

Sentinel Handle control assembly which comprise of hand crank and gear box, control housings, drive cable and safety connector. Used to propel the source to the exposure position and back.

Ultrasonic Inspection equipment

Olympus Epoch XT

The EPOCH XT is an advanced digital ultrasonic flaw detector. It offers standard measurement features which includes a tunable square wave pulser, selectable narrow-band and broad-band digital filters, gain range from 0 to 110dB, peak memory and peak hold, and adjustable PRF.

Ultrasonic Thickness Measurement equipment

Olympus 38DL Plus

The 38DL plus is an instrument used in ultrasonic thickness gaging. The equipment can be used from wall thinning measurements to very precise thickness measurements of thin or multilayer materials with a single element transducers.